Accessing general IEEE Std. 1687 networks via functional ports
Reconfigurable scan networks (RSNs), like IEEE Std. 1687 networks, offer flexible and scalable access to embedded (on- chip) instruments. These networks are typically accessed from the outside via a dedicated test port, like the test access port (TAP) of IEEE Std. 1149.1. As not all integrated circuits have a dedicated test port, the IEEE Std. P1687.1 working group is exploring how existing functi
