Signal-to-noise criterion for free-propagation imaging techniques at free-electron lasers and synchrotrons
We propose a signal-to-noise criterion which predicts whether a feature of a given size and scattering strength, placed inside a larger object, can be retrieved with two common X-ray imaging techniques: coherent diffraction imaging and projection microscopy. This criterion, based on how efficiently these techniques detect the scattered photons and validated through simulations, shows in general th