Electronic and structural properties of the Cu - Bi2CaSr2Cu2O8 interface
The formation of the Cu-Bi2CaSr2Cu2O8 interface has been studied by photoelectron spectroscopy using synchrotron radiation. Photon energies in the range 20-1000 eV were utilized in order to probe both the valence band and to monitor chemical changes upon Cu deposition, as revealed by the core-level shifts. A strong chemical reaction between Bi2CaSr2Cu2O8 and Cu is manifested by the formation of me
