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This paper presents an overview of power system fault classification methods and challenges. It also contains some ideas about structured testing.

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Popular Abstract in Swedish Otillfredsställande inandningsluft på bl a arbetsplatser har satts i samband med utveckling av olika akuta och kroniska symptom såsom allergi, astma och kronisk bronkit. Vi vet att bakterier och svamp producerar ett stort antal ämnen som verkar irriterande eller är allergiframkallande. Misstankar har därför riktas mot olika mikrobiologiska ämnen i luften såsom endotoxinInhalation of air-borne microorganisms and components thereof can cause illnesses and diseases. However, lack of specific and sensitive methods for exposure assessment can pose problems in predicting health outcomes. Characterization of microbial load from indoor environments using gas chromatography-mass spectrometry (GC-MS) and/or tandem mass spectrometry (GC-MSMS) as well as various bioassays (

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In the West, everybody is now talking about the economic and financial crisis. The term ‘’crisis” has become a buzzword within both academic and policy communities. There is an enormous upsurge of scholarly interest in the effects of this crisis on public administration systems, and the role that public administration plays in these processes. The underlying belief is that the public administratio

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An extensive investigation of the multilamellar vesicles (La*), lamellar (La), and multiply connected sponge (L3) phase formed in surfactant systems is presented in this thesis. These membrane structures were studied using surfactant systems containing poly(oxyethylene) alkyl ethers, n-CnH2n+1(OCH2CH2) mOH, commonly abbreviated as CnEm. This class of nonionic surfactants, often viewed as short AB

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In this paper we propose a scheme for test planning and test access mechanism (TAM) design for stacked integrated circuits (SICs) that are designed in a core-based manner. Our scheme minimizes the test cost, which is given as the weighted sum of the test time and the TAM width. The test cost is evaluated for a test flow that consists of a wafer sort test of each individual chip and a package test