High-resolution ptychographic nanoimaging under high pressure with X-ray beam scanning
We present an approach to nanoscale-resolution high-sensitivity imaging of internal material structure under in situ/operando conditions for virtually any sample environment. When bulky or heavy sample environment is required state-of-the-art X-ray imaging techniques, such as scanning and full-field microscopy or holography fail to deliver high-resolution imaging capabilities due to either i) extr
