A 100-fJ/cycle Sub-VT Decimation Filter Chain in 65 nm CMOS
Measurements of a sub-threshold (sub-VT) decimation filter, composed of four half band digital (HBD) filters in 65 nm CMOS are presented. Different unfolded architectures are analyzed and implemented to combat speed degradation. The architectures are analyzed for throughput and energy efficiency over several threshold options. Reliability in the sub-VT domain is analyzed by Monte-Carlo simulations
