Characterization of Nanowire Devices Using Nano-Focused X-Ray Beams
The long absorption length of hard X-rays makes them ideal tools for investigating electronic and optoelectronic devices in realistic operational conditions. Modern X-ray optics reach the relevant length scales for single nanoelectronic devices. Here, methods to investigate single nanowire devices with nanofocused X-rays are discussed. The X-rays are used both as pump and probe of semiconductor na