Filtyp
Abstract – A new full-scale laboratory has been erected at Lund university in 2004. The main goal of the laboratory is to find cost-effective solutions which reduce the electricity use in offices and residential buildings. The facility contains four rooms for testing building components, especially glazing and shading systems. The roof has a platform for testing solar components and solar systems,
This paper introduces a real-time surveillance application for object tracking with capablilities of functioning on 25 f/s mode, implemented in a high efficient, high performance and low power smart camera WiCa (Wireless Camera) developed by NXP Research. The proposed application deals with the problem of constantly changing environments as light change, swaying branches, rain and noise introduced
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Regular column on theatre in the weekly newspaper Arbetaren (The Worker).
Activated sludge models (ASMs) have been widely used as a basis for further model development in wastewater treatment processes. Values for parameters to be used are vital for the accuracy of the modeling approach. A continuous stirred tank reactor (CSTR), as open respirometer with continuous flow for 20 h is used in ASMs. The dissolved oxygen (DO) profile for 11 days was monitored. It was found t
This conference paper discusses intersectuionality and Queer Studies.
The main purpose of this study was to learn more about how bicyclists and motor vehicle drivers in some Swedish cities interact at intersections and how the yielding rules, different intersection designs, vehicle flows and speed affect the behaviour. Field studies were performed at 25 crossings for six hours each. Cycle crossings on links, at three- and four-armed intersections as well as at roun
In this paper we address the test scheduling problem for system-on-chip. Different from previous approaches where it is assumed that all tests will be performed until completion, we consider the cases where the test process will be terminated as soon as a defect is detected. This is common practice in production test of chips. The proposed technique takes into account the probability of defect-det
