Power-Aware Test Planning in the Early System-On-Chip Design Exploration Process
Test application and test design, performed to ensure the production of fault-free chips, are becoming complicated and very expensive, especially in the case of SoCs (System-on-Chip), as the number of possible faults in a chip is increasing dramatically due to the technology development. It is therefore important to take test design into consideration as early as possible in the SoC design-flow in
