Chain characterisation of sub-circuits for the study of SRAM
Characterising the performance of ICs is a daunting task. With every year that passes, transistor technology keeps advancing and reducing in size. We are at a moment where, due to working with sub-90nm processes, it is not possible to have complete control over the manufacturing of the chips on the silicon wafers. It is mandatory to characterise the behaviour of each transistor using statistics, n