PIXE in 1980: Summary of the Second International Conference on Particle Induced X-Ray Emission and its Analytical Applications
The Second International Conference on Particle Induced X-ray Emission (PIXE) and its analytical applications was held in Lund, Sweden, June 9-12, 1980. About a hundred papers were presented, including seven invited talks (PIXE and particle scattering, microbeam analysis (2), applications to aerosols (2) and biological samples (2)). The main impression left by the conference was that both the PIXE
