Optically trapped non-linear particles as probes for scanning near-field optical microscopy
We use the frequency doubled light from an optically trapped lithium niobate particle for non-intrusive scanning near-field optical microscopy. The detected power from this 50-100 nm diameter probe is currently tens of pW and is expected to approach nW with an improved detection system. The current experimental resolution is approximately 0.5 [mu]m, while the ultimate theoretical resolution is 70-
